A New Universal Test Pattern Auto-generating Approach for FPGA Logic Resources (abstract only).
Yirong OuYangJiarong TongPublished in: FPGA (2005)
Keyphrases
- resource allocation
- multi valued
- resource management
- modal logic
- classical logic
- high speed
- higher level
- hardware implementation
- pattern discovery
- real time
- learning resources
- predicate logic
- high level
- propositional dynamic logic
- digital signal
- computing resources
- data acquisition
- information resources
- test data
- low cost
- low level
- image processing
- knowledge base