Test sequence compaction methods for acyclic sequential circuits using a time expansion model.
Toshinori HosokawaTomoo InoueToshihiro HiraokaHideo FujiwaraPublished in: Systems and Computers in Japan (2002)
Keyphrases
- computational model
- statistical models
- probabilistic model
- statistical model
- classification models
- prior knowledge
- hybrid method
- learning models
- statistical methods
- delay insensitive
- decision trees
- monte carlo simulation
- qualitative and quantitative
- linear regression
- mathematical model
- em algorithm
- computational cost
- significant improvement
- objective function