Login / Signup

Investigation of the Reliability of the Interconnection between Metal Electrode and Silicon Anchor in Silicon-on-Glass Process.

Mengxia LiuXianshan DongJian CuiQiancheng Zhao
Published in: NEMS (2021)
Keyphrases
  • space charge
  • high density
  • low cost
  • electric field
  • database
  • databases
  • website
  • process model
  • field effect transistors
  • real time
  • data sets
  • information systems
  • control system
  • high speed
  • highly reliable