Determining the Convergence of Synchronous Measurements for Embedded Industrial Applications.
John LeisDavid ButtsworthPublished in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
- industrial applications
- industrial systems
- embedded systems
- faster convergence
- systems engineering
- convergence rate
- learning algorithm
- stochastic approximation
- measurement noise
- computational modeling
- global convergence
- convergence speed
- information systems
- cognitive science
- computational intelligence
- software engineering
- multi objective
- evolutionary algorithm
- convergence analysis
- expert systems
- real world
- convergence theorem