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A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for Non-Contact Wafer Probe Test.
Eleonora Franchi Scarselli
Luca Perilli
Luca Perugini
Roberto Canegallo
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
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user interface
input output
embedded systems
high speed
design process
experimental design
circuit design
dynamic random access memory
data structure
single chip
cmos technology
metal oxide semiconductor