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A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control.

Mauro OlivieriGiuseppe ScottiAlessandro Trifiletti
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2005)
Keyphrases
  • circuit design
  • design process
  • high speed
  • cmos technology
  • active control
  • parameter estimation
  • mixed signal
  • chip design
  • analog to digital converter
  • power dissipation
  • delay insensitive
  • cmos image sensor