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Statistical full-chip total power estimation considering spatially correlated process variations.

Zhigang HaoSheldon X.-D. TanGuoyong Shi
Published in: Integr. (2013)
Keyphrases
  • spatially correlated
  • power consumption
  • low cost
  • high speed
  • data sets
  • three dimensional
  • image sequences
  • active learning
  • statistical analysis
  • statistical methods
  • ibm power processor