Login / Signup

Thermal deformation measurements and predictions of MAP-BGA electronic packages.

M. Y. TsaiW. C. ChiangT. M. LiuG. H. Hsu
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • solder ball connect
  • infrared
  • maximum a posteriori
  • deformable objects
  • measurement noise
  • neural network
  • image registration
  • finite element analysis
  • finite element method
  • stress response