Correction to: Designing the rule classification with oversampling approach with high accuracy for imbalanced data in semiconductor production lines.
Hsiao-Yu WangChenKun TsungChing-Hua HungChen-Huei ChenPublished in: Multim. Tools Appl. (2023)
Keyphrases
- imbalanced data
- production line
- class imbalance
- majority class
- classification models
- minority class
- imbalanced datasets
- class distribution
- imbalanced data sets
- support vector machine
- classification rules
- cost sensitive
- ensemble classifier
- multistage
- classification accuracy
- decision trees
- feature selection
- linear regression
- support vector
- production system
- feature vectors
- sampling methods
- svm classifier
- nearest neighbour
- image classification
- buffer allocation
- decision boundary
- ensemble methods
- pattern classification
- learning algorithm
- classification algorithm
- cost sensitive learning
- feature set
- nearest neighbor
- concept drift
- feature space
- feature extraction