Robust Wafer Classification With Imperfectly Labeled Data Based on Self-Boosting Co-Teaching.
Shuo ZhaoZikun ZhuXin LiYing-Chi ChenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
- labeled data
- text classification
- supervised learning
- unlabeled data
- semi supervised
- semisupervised learning
- class labels
- semi supervised learning
- semi supervised classification
- partially labeled data
- labeled and unlabeled data
- accurate classifiers
- active learning
- supervised learning algorithms
- learning algorithm
- co training
- training data
- fully supervised
- unsupervised learning
- label information
- labeling process
- domain adaptation
- labeled training data
- semi supervised learning algorithms
- machine learning
- labeled instances
- feature selection
- prior knowledge
- training set
- loss function
- data points
- support vector machine
- pattern classification
- labeled examples
- feature extraction
- unlabeled samples
- classification accuracy
- feature space
- supervised machine learning algorithms
- multi class
- reinforcement learning
- label propagation
- instance selection
- weakly supervised
- ensemble classifier
- weak classifiers
- ensemble methods
- cost sensitive
- learning process
- text categorization
- training samples