Characterization of an LVDS Link in 28 nm CMOS for Multi-Purpose Pattern Recognition.
Gianluca TraversiFrancesco De CanioValentino LiberaliAlberto StabilePublished in: ISCAS (2018)
Keyphrases
- pattern recognition
- cmos technology
- neural network
- machine learning
- signal processing
- image processing
- high speed
- silicon on insulator
- metal oxide semiconductor
- computer vision
- pattern recognition problems
- image analysis
- pattern analysis
- low cost
- recent advances
- high resolution
- feature extraction
- image sequences
- information retrieval
- real time
- power consumption
- pattern classification
- circuit design
- data sets