A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity.
Hassan MostafaMohab AnisMohamed I. ElmasryPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
- prediction model
- computational model
- probabilistic model
- theoretical framework
- statistical model
- neural network
- mathematical model
- machine learning
- simulation model
- neural network model
- network structure
- optimization process
- experimental data
- generation process
- data sets
- process model
- poisson process
- petri net
- error rate
- maximum likelihood
- high speed
- probability distribution
- wireless sensor networks
- cost function
- prior knowledge
- objective function
- training data
- high level
- genetic algorithm