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Parasitic effects on nanoassembly processes.

Thomas WichChristian StolleChristoph EdelerSergej Fatikow
Published in: IROS (2009)
Keyphrases
  • process model
  • artificial intelligence
  • feature selection
  • three dimensional
  • multiscale
  • data structure
  • cooperative
  • control system
  • learning styles
  • communication channels
  • stochastic processes