Study on Automatic Defect Report Classification System with Self Attention Visualization.
Rin HirakawaKeitaro TominagaYoshihisa NakatohPublished in: ICCE (2020)
Keyphrases
- classification systems
- pattern recognition
- decision trees
- machine learning
- classification accuracy
- image classification
- classification models
- decision rules
- statistical analysis
- empirical studies
- supervised learning
- feature vectors
- training set
- preprocessing
- knn
- machine learning algorithms
- support vector
- semi automatic
- fully automatic
- classification rules
- pattern classification
- learning environment
- case study
- statistical classification