Login / Signup

The "G-F" 2-Valued Formula Generating Complete Set of Tests to Multiple Faults.

Yunhuan ShengShaoqing Li
Published in: VLSI Design (1992)
Keyphrases
  • multiple faults
  • small number
  • database
  • machine learning
  • expert systems
  • databases
  • knowledge base
  • decision trees
  • data structure
  • probability distribution
  • user defined