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Testing and evaluating the quality-level of stratified multichip module instrumentation.

Nohpill ParkFabrizio LombardiVincenzo Piuri
Published in: IEEE Trans. Instrum. Meas. (2001)
Keyphrases
  • quality assurance
  • levels of abstraction
  • image processing
  • test cases
  • higher quality
  • data sets
  • image analysis
  • multiresolution
  • computational intelligence
  • steady state
  • quality prediction