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Improved Performance of SRAM-Based True Random Number Generator by Leveraging Irradiation Exposure.
Xu Zhang
Chunsheng Jiang
Gang Dai
Le Zhong
Wen Fang
Ke Gu
Guoping Xiao
Shangqing Ren
Xin Liu
Sanyong Zou
Published in:
Sensors (2020)
Keyphrases
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random number generator
random number
power consumption
fingerprint authentication
neural network
high dimensional data
low power
data sets
image sequences
image quality
improved algorithm
pseudorandom
electron beam
random access memory