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Estimation of the Complex Permittivity of a Bi-layer Dielectric Material in X-Band Frequencies.
Lahcen Ait Benali
Abdelwahed Tribak
Jaouad Terhzaz
Angel Mediavilla
Published in:
ICCWCS (2017)
Keyphrases
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complex data
complex systems
multi layer
higher level
parameter estimation
business intelligence
silicon dioxide
upper layer
estimation accuracy
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estimation algorithm
density estimation
data sets
end users
multiresolution
data analysis
case study
real world
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