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Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories.

Nian-Jia WangKuan-Yi LeeHsin-Yi LinWei-Hao HsiaoMing-Yi LeeLi-Kuang KuoDing-Jhang LinYen-Hai ChaoChih-Yuan Lu
Published in: IRPS (2020)
Keyphrases
  • statistical analysis
  • bit errors
  • packet loss
  • multiscale
  • error correction
  • peer to peer