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A spatiotemporal attention operator for monitoring thermo-mechanical stress in wafer-scale integrated circuits using an infrared camera.

Ahmed LakhssassiRoman PalenychkaMichel SaydeYvon SavariaMarek B. ZarembaEmmanuel Kengne
Published in: ISPA (2013)
Keyphrases
  • integrated circuit
  • infrared camera
  • infrared
  • space time
  • moving objects
  • electron beam
  • low cost
  • video streams
  • visual attention
  • printed circuit boards
  • multimedia
  • image sequences
  • multiscale