Login / Signup
Stress imaging in structural challenging MEMS with high sensitivity using micro-Raman spectroscopy.
Peter Meszmer
Raul D. Rodriguez
Evgeniya Sheremet
Dietrich R. T. Zahn
Bernhard Wunderle
Published in:
Microelectron. Reliab. (2017)
Keyphrases
</>
high sensitivity
raman spectra
optical fiber
high resolution
image processing
structural information
imaging systems
infrared
structural analysis
multi component
image analysis
real world
medical imaging
clinical applications
imaging devices
x ray
acquired images
synthetic aperture sonar