Full-wave PEEC time-domain method for the modeling of on-chipinterconnects.
Phillip J. RestleAlbert E. RuehliSteven G. WalkerGeorge PapadopoulosPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2001)
Keyphrases
- high precision
- experimental evaluation
- mathematical model
- computational cost
- probabilistic model
- high accuracy
- modeling method
- main contribution
- error rate
- computer vision
- evaluation method
- optimization method
- fully automatic
- statistical model
- segmentation method
- experimental study
- significant improvement
- detection method
- clustering method
- mutual information
- cost function
- prior knowledge
- high dimensional
- preprocessing
- support vector
- image sequences
- genetic algorithm