Login / Signup
Progress and Current Topics of JEDEC JC-70.1 Power GaN Device Quality and Reliability Standards Activity: Or: What is the Avalanche capability of your GaN Transistor?
Tim McDonald
Stephanie Watts Butler
Published in:
IRPS (2021)
Keyphrases
</>
structuring elements
power consumption
high quality
cost effectiveness
quality measures
power dissipation
real time
steady state
mathematical morphology
quality assessment
integrated circuit
product quality
reliability analysis
quality attributes
physical activity
equivalent circuit