An efficient algorithm for parametric fault simulation of monolithic IC's.
Andrzej J. StrojwasStephen W. DirectorPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
- preprocessing
- learning algorithm
- matching algorithm
- mathematical model
- worst case
- optimization algorithm
- improved algorithm
- cost function
- expectation maximization
- dynamic programming
- experimental evaluation
- computational cost
- detection algorithm
- segmentation algorithm
- computationally efficient
- particle swarm optimization
- convex hull
- simulated annealing
- np hard
- times faster
- k means
- similarity measure
- single pass
- simulation study
- convergence rate
- fault detection
- classification algorithm
- monte carlo
- input data
- probabilistic model
- multi objective
- search space
- expert systems
- feature selection