Improving LLM Classification of Logical Errors by Integrating Error Relationship into Prompts.
Yanggyu LeeSuchae JeongJihie KimPublished in: ITS (1) (2024)
Keyphrases
- pattern classification
- classification systems
- automatic classification
- support vector
- pattern recognition
- classification method
- support vector machine svm
- machine learning
- error analysis
- classification process
- image classification
- decision trees
- support vector machine
- classification models
- cost sensitive
- error minimization
- feature extraction
- feature space
- classification algorithm
- measurement errors
- class labels
- feature vectors
- supervised learning
- measurement error
- residual error
- error accumulation
- neural network
- systematic errors
- classification scheme
- classification rules
- machine learning methods
- decision rules
- cross validation
- error rate
- naive bayes
- knowledge base
- feature selection