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Reliability of modular mesh-connected intelligent storage brick systems.

Claudio FleinerRobert B. GarnerJames Lee HafnerK. K. RaoDeepak R. Kenchammana-HosekoteWinfried W. WilckeJoseph S. Glider
Published in: IBM J. Res. Dev. (2006)
Keyphrases
  • intelligent systems
  • mesh connected
  • artificial intelligence
  • image processing
  • multiscale
  • image analysis
  • gray scale