Margin Elimination Through Timing Error Detection in a Near-Threshold Enabled 32-bit Microcontroller in 40-nm CMOS.
Hans ReyserhoveWim DehaenePublished in: IEEE J. Solid State Circuits (2018)
Keyphrases
- error detection
- magnetic tape
- low cost
- error correction
- nm technology
- random access memory
- cmos technology
- error recovery
- single chip
- data cleansing
- design considerations
- fault tolerance
- low power
- silicon on insulator
- analog to digital converter
- power consumption
- metal oxide semiconductor
- error correcting
- high speed
- fault isolation
- error resilient
- control system
- support vector
- multi agent
- error control
- training set
- cmos image sensor
- neural network
- hardware implementation
- multi agent systems
- low voltage
- image quality
- intelligent systems
- data collection