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Analysis of 9T Subthreshold SRAM With Bit-Interleaving Scheme in 65-nm CMOS.

Ming-Hung ChangYi-Te ChiuWei Hwang
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2012)
Keyphrases
  • random access memory
  • image analysis
  • high speed
  • statistical analysis
  • data sets
  • neural network
  • data analysis
  • data acquisition
  • data transmission
  • cmos technology