Resolution FoM in 65-nm CMOS.
Dan ShiKa-Meng LeiRui Paulo MartinsPui-In MakPublished in: IEEE J. Solid State Circuits (2023)
Keyphrases
- cmos technology
- silicon on insulator
- nm technology
- high speed
- power consumption
- low power
- low cost
- consequence finding
- metal oxide semiconductor
- low resolution
- image resolution
- conflict detection
- low voltage
- database
- high resolution
- three dimensional
- delay insensitive
- analog vlsi
- vlsi circuits
- transmission electron microscopy
- sampling rate
- parallel processing
- neural network