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The Influence of Process Variations on the Halo MOSFETs and its Implications on the Analog Circuit performance.

K. NarasimhuluSiva G. NarendraV. Ramgopal Rao
Published in: VLSI Design (2004)
Keyphrases
  • analog circuits
  • neural network
  • knowledge base
  • hidden markov models
  • high speed
  • pattern matching
  • fault diagnosis
  • process model