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The improvement of HEIP immunity using STI engineering at DRAM.
Seung Uk Han
Youngyoun Lee
Yongdoo Kim
Jemin Park
Junhee Lim
Satoru Yamada
Hyeongsun Hong
Kyupil Lee
Gyoyoung Jin
Eunseung Jung
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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main memory
engineering design
computer science
high density
data sets
software engineering
multi objective optimization
low voltage
real time
machine learning
artificial intelligence
significant improvement
low cost
engineering problems