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Minimum Supply Voltage and Yield Estimation for Large SRAMs Under Parametric Variations.
Jiajing Wang
Benton H. Calhoun
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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parametric models
semi parametric
real time
databases
monte carlo simulation
accurate estimation
image processing
learning environment
artificial neural networks
parameter estimation
density estimation
robust estimation
estimation accuracy
estimation process