ANOVA-based RF DNA Analysis - Identifying Significant Parameters for Device Classification.
Kevin S. KuciapinskiMichael A. TempleRandall W. KleinPublished in: WINSYS (2010)
Keyphrases
- pattern recognition
- feature selection
- statistical analysis
- image analysis
- machine learning
- feature vectors
- classification scheme
- parameter space
- support vector machine
- training set
- feature space
- feature extraction
- data sets
- support vector
- model selection
- statistically significant
- learning algorithm
- pattern classification
- parameter values
- automatic classification
- neural network