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Comparative Analysis of Ultra-Low Current Measurement Topologies With Implementation in 130 nm Technology.

Sarath Kundumattathil MohananHamza BoukabacheDaniel PerrinUllrich R. Pfeiffer
Published in: IEEE Access (2021)
Keyphrases
  • comparative analysis
  • current status
  • fusion scheme
  • semi quantitative
  • future development
  • implementation details
  • real time
  • high speed
  • databases
  • computer vision
  • case study
  • pattern matching
  • nm technology