An automatic defect-inspection method for optical isolators using image analysis.
Tian QiuZhiquan LinChen Jung TsaiChi Shing WongXin ZhangShuaiqi LiuHonglong NingPublished in: Autom. (2022)
Keyphrases
- high accuracy
- image analysis
- preprocessing
- classification method
- computationally efficient
- mutual information
- detection method
- visual inspection
- dynamic programming
- computational cost
- classification accuracy
- support vector machine
- cost function
- significant improvement
- scale space
- k means
- theoretical analysis
- synthetic data
- objective function
- high precision