Device noise in silicon RF technologies.

Samuel S. Martin Vance D. Archer David M. Boulin Michel R. Frei Kwok Ng Ran-Hong Yan

Published in: Bell Labs Tech. J. (1997)

Keyphrases

semiconductor devices
signal to noise ratio
emerging technologies
radio frequency
low cost
random noise
high speed
missing data
noisy data
noise level
additive noise
relevance feedback
scanning devices
metal oxide semiconductor
field effect transistors
noise model
noisy environments