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An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers.
Hossein Eslahi
Sayed Ali Albahrani
Dhawal Mahajan
Sourabh Khandelwal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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analytical model
long term
high power
short term
analytical models
simulation model
power consumption
low power
bit error rate
neural network
artificial neural networks
multiscale
case study
power supply
metadata
load forecasting
digital preservation
power distribution
database
wastewater treatment