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Increasing testability by clock transformation (getting rid of those darn states).

Krishna B. RajanDavid E. LongMiron Abramovici
Published in: VTS (1996)
Keyphrases
  • high speed
  • state variables
  • test data generation
  • power consumption
  • artificial intelligence
  • information systems
  • metadata
  • digital libraries
  • user interface
  • special case