Parallely testable design for detection of neighborhood pattern sensitive faults in high density DRAMs.

Ju Yeob Kim Sung Je Hong Jong Kim

Published in: ISCAS (6) (2005)

Keyphrases

high density
object detection
case study
pattern matching
data center
design principles
thin film
low density
close proximity
magnetic recording
neural network
data mining
control system
detection rate
detection accuracy