Methodology of semiconductor devices classification into groups of differentiated quality.
Alicja KonczakowskaPublished in: Microelectron. Reliab. (2008)
Keyphrases
- semiconductor devices
- classification accuracy
- pattern recognition
- pattern classification
- decision trees
- feature extraction
- machine learning
- high quality
- support vector machine svm
- data quality
- automatic classification
- classification scheme
- preprocessing
- support vector machine
- feature selection
- neural network
- state space
- image classification
- training samples
- benchmark datasets
- classification method
- classification models