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Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs.

Sudarshan BahukudumbiSule OzevKrishnendu ChakrabartyVikram Iyengar
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
  • mixed signal
  • low power
  • vlsi circuits
  • multimedia
  • energy consumption
  • power consumption
  • massively parallel