Login / Signup

Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs.

Vishnupriya ShivakumarChinnaiyan SenthilpariZubaida Yusoff
Published in: Microelectron. J. (2022)
Keyphrases
  • built in self test
  • integrated circuit
  • databases
  • power consumption
  • higher quality
  • automated reasoning
  • defeasible logic