Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.
Jian Wei ChengMelanie Po-Leen OoiChris ChanYe Chow KuangSerge N. DemidenkoPublished in: DELTA (2010)
Keyphrases
- benchmark datasets
- classification algorithm
- classification accuracy
- computationally efficient
- uci machine learning repository
- pattern recognition
- classification rules
- high speed
- orders of magnitude
- feature space
- automatic classification
- learning algorithm
- semiconductor manufacturing
- data mining
- pattern classification
- terms of classification accuracy
- machine learning algorithms
- model selection
- decision trees
- text classification
- image classification
- optimization problems
- support vector machine
- significant improvement
- computational complexity
- support vector
- feature selection
- machine learning
- data sets