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Practical Design Considerations for Wide Locally Recoverable Codes (LRCs).

Saurabh KadekodiShashwat SilasDavid ClausenArif Merchant
Published in: ACM Trans. Storage (2023)
Keyphrases
  • design considerations
  • wide range
  • practical application
  • real world
  • low voltage
  • random access memory
  • error correction
  • data sets
  • data structure
  • learning process
  • practical problems