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VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips.

Somnath PaulRajat Subhra ChakrabortySwarup Bhunia
Published in: VTS (2007)
Keyphrases
  • secret key
  • security level
  • low overhead
  • authentication scheme
  • lightweight
  • key management
  • block cipher
  • data sets
  • high precision
  • high reliability