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VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips.
Somnath Paul
Rajat Subhra Chakraborty
Swarup Bhunia
Published in:
VTS (2007)
Keyphrases
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secret key
security level
low overhead
authentication scheme
lightweight
key management
block cipher
data sets
high precision
high reliability