Artificial Neural Network Based Test Escape Screening Using Generative Model.
Michihiro ShintaniMichiko InoueYoshiyuki NakamuraPublished in: ITC (2018)
Keyphrases
- latent dirichlet allocation
- generative model
- topic models
- probabilistic model
- bayesian framework
- em algorithm
- mixture model
- semi supervised
- posterior probability
- prior knowledge
- discriminative learning
- generative and discriminative models
- expectation maximization
- discriminative models
- object categories
- markov chain monte carlo
- low level
- pairwise
- multiscale
- clustering algorithm
- fully bayesian
- machine learning