Frequency domain thickness measurement approach for microscale multilayered structures.
Chen LiCetin CetinkayaPublished in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
- frequency domain
- spatial domain
- fourier transform
- cross correlation
- low pass
- denoising
- low frequency
- power spectrum
- feature extraction
- power spectra
- subband
- frequency domain analysis
- spectral domain
- facial asymmetry
- bandpass
- frequency analysis
- affine invariance
- computer vision
- fourier analysis
- fourier domain
- discrete fourier transform