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Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits.
José Machado da Silva
José Silva Matos
Published in:
ED&TC (1996)
Keyphrases
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cross correlation
low voltage
mixed signal
vlsi circuits
template matching
mutual information
frequency domain
multi channel
cmos technology
low power
design considerations
feature extraction
machine learning
object oriented
low cost