A method for pseudo-exhaustive test pattern generation.
Dimitrios KagarisFillia MakedonSpyros TragoudasPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- detection method
- clustering method
- optimization method
- high precision
- experimental study
- cost function
- dynamic programming
- neural network
- computationally efficient
- optimization algorithm
- preprocessing
- high accuracy
- statistical model
- detection algorithm
- main contribution
- classification accuracy
- computational cost
- multiresolution
- optimal solution
- clustering algorithm
- image processing