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/TiN-capping/TiAl gate stacks.
Hong Yang
Luwei Qi
Yanbo Zhang
Bo Tang
Qianqian Liu
Hao Xu
Xueli Ma
Xiaolei Wang
Yongliang Li
Huaxiang Yin
Junfeng Li
Huilong Zhu
Chao Zhao
Wenwu Wang
Tianchun Ye
Published in:
Sci. China Inf. Sci. (2020)
Keyphrases
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nano scale
image processing
multi agent systems
printed circuit boards
multiple input
neural network
high dimensional
digital images
field effect transistors